LUMiKON
State-of-the-art PL imaging for perovskite, silicon, and perovskite-silicon tandem solar cells
LUMiKON MINI
LUMiKON MINI is a compact photoluminescence imaging system that enables high-throughput screening of promising materials by measuring the true implied open-circuit voltage (iVoc) [1].
Every system is glovebox-compatible, allowing researchers to deposit films and immediately measure their samples, without fear of oxidation or degradation. Our design ensures an exceptional user experience through the ability to load samples and initiate fully-automated image acquisition, without the user needing to remove their hands from the gloves. While the system is primarily intended for glovebox use, it is equally at home on a bench top.
A dual-wavelength model for perovskite and perovskite-silicon tandem devices is currently under development.
Download the datasheet here.
System features
- Correction for background, vignetting, distortion, and non-linearities
- Fully-automated changing of filters, illumination and camera settings
- Better than 5% non-uniformity of irradiance at the sample plane
- Irradiance control from 0.01 to 1.2 Suns equivalent current
- Light-tight and interlocked enclosure, meeting EU safety standards
- Guided and semi-automated system calibration procedure for iVoc images
LUMiKON MAX
LUMiKON MAX is our flagship luminescence imaging system and is intended for tandem and multi-junction cells of up to 300mm square.
It is a dual-wavelength Class 1 laser system and, like the MINI, enables screening of promising materials by directly producing images of the true implied open-circuit voltage [1]. The system can be configured with various cameras and objectives, with the ability to resolve defects down to 11μm in size. A temperature-controlled stage ensures stable and repeatable measurements, while the 4-quadrant power supply enables voltage or current biasing for electroluminescence and built-in IV measurement.
We also offer two options for measuring spectral information at each image pixel. This information is critical for determining properties such as material composition and bandgap energy. The two options can be ordered separately, or combined for ultimate flexibility.
Download the datasheet here.
Available options
- Rapid area-scanned hyperspectral imaging [2]
- Point-scanned spectral measurement [3]
- Additional wavelength for measuring triple-junction devices
- Electroluminescence (EL) imaging with a custom contacting stage
- Motorized QTH lamp for periodic calibration checks
- Custom light biasing and pre-measurement soaking options
- Implementation of custom algorithms and UI changes
Notes:
[1] Arman Mahboubi Soufiani et al., ‘Implied Open-circuit Voltage Imaging via a Single Bandpass Filter Method – Its First Application in Perovskite Solar Cells’, 2022, Adv. Funct. Mater., DOI: 10.1002/adfm.202210592
[2] Our area-scanned hyperspectral option acquires the emission spectrum at every single image pixel in less than 30s, through the use of a novel interferometric camera that enables both shorter acquisition times and finer spectral resolution than conventional line-scan cameras
[3] Our point-scanned hyperspectral option allows researchers to acquire the emission at user-defined image pixels, and is not recommended for full area imaging. Unlike the area-scanned method, it enables rapid spectral acquisition at a single point, which can be useful for studying temporal behaviour, such as degradation, under illumination or current injection.